Abstract
Characteristics of a planar double-reflector aplanatic Schwarzschild system that allow estimation of the efficiency of its application in devices of integrated microwave optics are analyzed. The results of multicriteria optimization of the system’s quality indices are obtained. The aplanatic system is compared to systems with parabolic reflectors: a single-reflector system and a double-reflector system with flat subreflector. It is shown that the results of optimization obtained in the approximation of physical optics agree well with the results of the analysis and minimization of aberrations in the reflector system performed with the use of the proposed criterion of rms aberrations. Scanning characteristics of Pareto-optimal planar aplanats are presented.
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