Abstract
Nitrogen doped ZnCdO films [ZCO:N] have been grown on quartz substrates by radio frequency (RF) reactive magnetron sputtering technique, and the effect of the ratio of nitrogen to argon gas flow [N2:Ar] on their electrical, microstructure and optical properties were investigated by Hall effect, energy dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission electron microscope (TEM), optical absorbance and photoluminescence (PL) measurements. The results indicate that all the ZCO:N films are of hexagonal wurtzite structure with highly (002) preferential orientation. As the N2:Ar increases from 0:1 to 4:1, the absorption edge for the samples exhibits blue shift. Hall effect measurement results indicate that the N2:Ar exerts an immense influence on the p-type conduction conversion for ZCO:N film. It is found that ZCO:N film deposited at the N2:Ar of 1:2 shows the optimal p-type behavior, which has a carrier concentration of 1.10×1017cm−3, a mobility of 3.28cm2V−1s−1 and a resistivity of 17.3Ωcm. Compared with the other samples, ZCO:N film fabricated at the relatively lower N2:Ar possesses the superior crystal quality, luminescent and electrical properties. Additionally, a possible mechanism of p-type conduction for ZCO:N film was discussed in this work.
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