Abstract
The influence of deposition conditions of nucleation GaN layer on the properties of high-temperature GaN layer, grown on sapphire substrates, was investigated. The hydride vapor phase epitaxy (HVPE) three-section horizontal hot-wall furnace technique was applied. Various temperatures, HCl flows and time intervals of nucleation layer growth were utilized. Based on previous studies the following experimental conditions were selected: temperature was kept at 450 or 570 °C, and HCl flows were 8 or 10 sccm/min. The duration of nucleation layer deposition was 5, 7 and 9 min. The scanning electron microscopy technique was applied for the investigation of nucleation layer morphology after migration. Thick GaN layers were deposited during the three-step growth process at 1060 °C. Samples with various surface morphologies were obtained. Photoluminescence spectra and X-ray measurements were performed, which permitted clarifications of the influence of growth conditions of the nucleation layer on the properties of high-temperature layers.
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