Abstract
The optimization of etchants for electrochemical etching of fast-neutron-induced recoil tracks in polycarbonate neutron personnel dosimeters was investigated with the aim to explore reasons for the formation of two “plateaus” on the sensitivity-KOH concentration response and a “cyclic-type” variation in the mean recoil track diameter (MRTD)-concentration response previously obtained. The same type of variations were obtained again using NaOH, KOH, and PEW mixtures applying 32 kV/cm, 2 kHz at 25 °C. A white layer formation occurred beyond a certain concentration in NaOH and KOH showing no tracks. The mean alpha track diameter-ethanol concentration responses for different alpha energies each had almost a linear response. To justify the variations, a descriptive “bulk etch model” was proposed which explains the two plateaus and the formation of cyclic variations. By comparing the recoil and alpha track data, the cyclic-type variations can be stated to be only the characteristic of fast-neutron-induced recoil tracks.
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