Optimization of bist resources during high-level synthesis

Abstract

Lower bound estimations of functional resources at various stages of high-level synthesis have been developed to guide synthesis algorithms toward optimal solutions. In this paper we present lower bounds on the number of test resources (i.e., registers that generate pseudo-random test patterns and/or compress test responses) required to test a synthesized data path using built-in self-test (BIST). The bounds on different types of test resources are proved to be individually achievable and experiments show that in most cases the bounds can be achieved simultaneously and with minimum number of functional registers. Efficient ways of computing the lower bounds are developed. The estimations are performed on scheduled data flow graphs with a given module assignment and provide a practical way of selecting or modifying module assignments and schedules such that the resulting synthesized data path requires a small number of BIST resources to test itself.