Abstract
The paper describes the application of the azimuthal scan technique for absolute structure determination using X-ray anomalous dispersion. A diffraction pattern with rotation around the scattering vector provides information about various anisotropic effects: absorption, extinction and multi-beam interaction. Recording of azimuthal scans for Friedel pairs is proposed as an alternative to single reflection measurement. Several factors affecting the smoothness of the azimuthal scan curves are discussed and a procedure for eliminating various sources of errors, involving a Fourier filtering, is proposed in order to increase feasibility of chiral discrimination.
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