Abstract
Photoalignment allows precise control of anchoring energy, which enables the optimization of the alignment quality of ferroelectric liquid crystal (FLC) devices. Thus, the accurate measurement of the anchoring energy coefficient of the alignment layer in the FLC regime is critical. However, the methods proposed to date have several limitations and are not useful for FLC cells with a helical structure. In this paper, a method based on the evaluation of the optical relaxation time is proposed. The method is valid for both helical and helix-free FLC cells. The optimal anchoring energy to achieve the best alignment quality of FLCs is also investigated.
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