Optimization of a multilayer Laue lens system for a hard x-ray nanoprobe

Abstract

Detailed designs of a multilayer Laue lens system for a hard x-ray nanoprobe, including flat and wedged types, are presented, to realize nanoscale point focus and high diffraction efficiency simultaneously. The difficulty of movement and alignment for lens, aperture and sample are considered in the optimization process. Considering the practical requirements of future experiments, the features of the beamline and the structural imperfections, the working energy range, the beam vibration and structural errors are estimated and discussed.