Abstract
We present the optimization of a birefringence-enhanced-waveguide (BWG)-based polarization beam splitter (PBS) in a Mach-Zehnder interferometer (MZI) configuration and analyze the structure-dependent or polarization-dependent phase difference, using a delay-line MZI (DL-MZI). We fabricate the DL-MZI using silica-based planar lightwave circuit technology and, using the DL-MZI, demonstrate the ability to optimize a PBS by measuring the birefringence of the BWG and structure-dependent phase offset.
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