Abstract
High-resolution electron microscopy is used to study the initial growth of different REBa 2Cu 3O 7− δ thin films. In DyBa 2Cu 3O 7− δ ultra-thin films, deposited on TiO 2 terminated SrTiO 3, two different types of interface arrangements occur: bulk–SrO–TiO 2–BaO–CuO–BaO–CuO 2–Dy–CuO 2–BaO–bulk and bulk–SrO–TiO 2–BaO–CuO 2–Dy–CuO 2–BaO–CuO–BaO–bulk. This variable growth sequence is the origin of the presence of antiphase boundaries. In Nd 1+ x Ba 2− x Cu 3O 7− δ thin films, antiphase boundaries tend to annihilate by the insertion of extra Nd-layers. This annihilation is correlated with the flat morphology of the film and the absence of growth spirals at the surface of the Nd-rich films.
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