Abstract
The performance of the most widely used shapers in solid state detector spectrometers is investigated in respect to noise suppression and count rate ability. Three shaper types have been experimentally checked with two detector types – X-ray Silicon Drift Detector and HPGe gamma detector. The results show small difference in noise line width and negligible difference in obtainable energy resolution while the high count rate performance depends noticeably on shaper type selected. This allows for simultaneous optimization of noise and count rate performance.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
