Optimal plan for Wiener constant-stress accelerated degradation model

Abstract

This paper explores inferential procedures for the Wiener constant-stress accelerated degradation model under degradation mechanism invariance. The exact confidence intervals are obtained for the parameters of the proposed accelerated degradation model. The generalized confidence intervals are also proposed for the reliability function and pth quantile of the lifetime at the normal operating stress level. In addition, the prediction intervals are developed for the degradation characteristic, lifetime and remaining useful life of the product at the normal operating stress level. The performance of the proposed generalized confidence intervals and the prediction intervals is assessed by the Monte Carlo simulation. Furthermore, a new optimum criterion is proposed based on minimizing the mean of the upper prediction limit for the degradation characteristic at the design stress level. The exact optimum plan is also derived for the Wiener accelerated degradation model according to the proposed optimal criterion. The proposed interval procedures and optimum plan are the free of the equal testing interval assumption. Finally, two examples are provided to illustrate the proposed interval procedures and exact optimum plan. Specifically, based on the degradation data of LEDs, some interval estimates of quantities related to reliability indicators are obtained. For the degradation data of carbon-film resistors, the optimal allocation of test units is derived in terms of the proposed optimal criterion.