Optimal one-dimensional inversion and bounding of magnetotelluric apparent resistivity and phase measurements

Abstract

The properties of the log of the admittance in the complex frequency plane lead to an integral representation for one-dimensional magnetotelluric (MT) apparent resistivity and impedance phase similar to that found previously for complex admittance. The inverse problem of finding a one-dimensional model for MT data can then be solved using the same techniques as for complex admittance, with similar results. For instance, the one-dimensional conductivity model that minimizes the χ 2 misfit statistic for noisy apparent resistivity and phase is a series of delta functions. One of the most important applications of the delta function solution to the inverse problem for complex admittance has been answering the question of whether or not a given set of measurements is consistent with the modeling assumption of one-dimensionality. The new solution allows this test to be performed directly on standard MT data. Recently, it has been shown that induction data must pass the same one-dimensional consistency test if they correspond to the polarization in which the electric field is perpendicular to the strike of two-dimensional structure. This greatly magnifies the utility of the consistency test. The new solution also allows one to compute the upper and lower bounds permitted on phase or apparent resistivity at any frequency given a collection of MT data. Applications include testing the mutual consistency of apparent resistivity and phase data and placing bounds on missing phase or resistivity data. Examples presented demonstrate detection and correction of equipment and processing problems and verification of compatibility with two-dimensional B-polarization for MT data after impedance tensor decomposition and for continuous electromagnetic profiling data.