Abstract
Diagnosis strategies are investigated for repairable VLSI and WSI structures based on integrated diagnosis and repair. Knowledge of the repair strategy, the probability of each unit being good, and the expected test time of each unit is used by the diagnosis algorithm to select units for testing. The general problem is described, followed by an examination of a specific case. For k-out-of-n structures, a complete proof is given for the optimal diagnosis procedure of Y. Ben-Dov (1981). A compact representation of the optimal diagnosis procedure is described, which requires O(n/sup 2/) space and can be generated in O(n/sup 2/) time. Simulation results are provided to show the improvement in diagnosis time over online repair and offline repair. >
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