Abstract
Abstract Design for accelerated degradation tests (ADTs) in most literature concentrates on the case of just one stress, but the performance of many highly reliable products are affected by several stresses simultaneously, so it is necessary to study the optimal models for the ADTs with several stresses. This article first introduces a basic modeling framework of degradation path and then proposes an optimal model for ADTs with several stresses based on Wiener process. Under the constraint of total experimental cost, sample size, measurement times, and measurement frequency are obtained by minimizing the asymptotic variance of the estimated 100pth percentile of the product's lifetime distribution. Finally, a numerical example is presented to illustrate the proposed model.
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