Abstract
The use of Optically Stimulated Luminescence (OSL) for radiation dosimetry has become increasingly popular in recent years. The OSL method is based on luminescence emitted from semiconductor materials stimulated with specific wavelengths of light, after being exposed to ionizing radiation. The OSL intensity is a function of the radiation dose absorbed by the material. This work complements previous studies by the authors of the thermoluminescence (TL) response by SiO2 commercial optical fiber exposed to ionizing radiation and provides preliminary results describing some of the material’s OSL properties. Linear OSL response to beta-radiation dose, along with a consistent shape of the photon emission curve with time, were observed using a green/blue OSL excitation laser. The reproducibility of OSL response after repeated irradiations and the change in intensity with time were also examined. The search for and characterization of materials that exhibit this OSL response, in parallel with the continued development of OSL methodology and instrumentation, is an important scientific and commercial issue.
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