Abstract
We report x‐ray excited optical luminescence (XEOL) from one‐dimensional nanostructures of ZnO excited with photon energies across the Zn K‐edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K‐edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x‐ray emission spectroscopy (XES). The Zn K‐edge decay dynamics was examined with time‐resolved x‐ray excited optical luminescence.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
