Abstract

Optical confinement in beta silicon carbide (β-SiC) thin films on sapphire substrate is demonstrated. Measurements are performed on waveguides formed by the mechanical transfer of thin β-SiC films to sapphire. Recent results of epitaxial films of SiC on sapphire substrates attest to the technological viability of optoelectronic devices made from silicon carbide. Far-field mode patterns are shown. We believe this is the first step in validating a silicon carbide optoelectronic technology.

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