Abstract

The use of surface plasmons is reported for the optical characterization of thin organic films, in particular thin polymer films at a metal dielectric interface. The basic properties of PSP are presented, including excitation and the technique of surface plasmon microscopy, which allows to obtain an image. As an example studies are presented on the trans-cis photoisomerization of azobenzene sidechain polymers in ultra thin films, prepared by the Langmuir-Blodgett-Kuhn technique. The transition from the trans to the cis state induces a change in the refractive index of the film. These changes were detected and their kinetics measured by a surface plasmon spectroscopy technique. A refractive index pattern could be written into the films and the areas of different refractive indices have been detected by surface plasmon microscopy.

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