Abstract
We report a systematic Raman and infrared (IR) study of Pr0.6Ca0.4MnO3 (PCMO) thin films grown on SrTiO3 (STO) and LaAlO3 (LAO) substrates (PCMO/STO and PCMO/LAO, respectively). The measurements were performed for a temperature range 78 K<T<295 K. The Ag(2) tilting Raman mode has shown substrate dependence, implying an effect of the lattice mismatch on the tilting angle, as the MnO6 octahedra are tilted to optimize the structure. The Raman and the IR modes are affected by the different kinds of strain induced by different substrates. In the mid-IR (MIR) region, there are broad bands implying that FM and AFM clusters are formed and competing even at RT.
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