Abstract
The state of polarization of ferroelectric thin films differing in structure is determined by optical second-harmonic microscopy. The ferroelectric is lead zirconate titanate, Pbx(Zr0.53Ti0.47)O3. The structural differences are produced by changing the fabrication conditions. In addition, the electrical properties of the same films are evaluated by conventional methods. Optical second-harmonic micrographs of the films and local optical-hysteresis loops are obtained. From the latter data, local dielectric-hysteresis loops are computed. A spatial resolution better than 1 μm is achieved.
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