Abstract
The optical properties of ZnTe and ZnS nanocrystals (ZnTe-NC and ZnS-NC) were determined by Spectroscopic Ellipsometry. The nanocrystals were embedded in a SiO2 matrix by ion implantation technique. Their sizes were characterized by transmission electron microscopy. The ZnTe-NC and ZnS-NC were modelled using Critical Points (CPs) dispersion formulas developed by Adachi. Besides the CPs model, the Tauc–Lorentz model was found to be another choice to get a good spectral fitting. Here we demonstrated that these models yield reasonable values of optical constants of II–VI nanocrystals. The best agreement was found with the experimental data over the entire range of 0.6 to 6.5eV.
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