Abstract
Transparent and conductive ZnS (32 nm)/Ag (16 nm)/ZnS (32 nm) (ZAZ) sandwich structures are deposited on BK7 substrates by vacuum thermal evaporation. Transparent conductive films have unique characteristics such as low resistivity, high optical transmittance in the visible region and high absorption in the ultraviolet regions. The structure of the films is determined by in situ HT-XRD method. The optical properties of the films are ascertained by UV–VIS spectrophotometer. The refractive index n and the extinction coefficient k are extracted from the results of spectroscopic ellipsometry measurements by utilizing the Cauchy model, the refractive index and effective dielectric function are determined.
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