Abstract
In this work, we present substrate orientation effects on optical properties in vertically stacked In0.5Ga0.5As layers grown by molecular beam epitaxy on (311)A/B and reference (100) GaAs substrates. Samples were grown for different GaAs spacer thicknesses. The spacer thickness variation shows the influence on PL spectra for all planes. The differences in peak shape, peak position, amplitude and integrated luminescence have been observed for all surfaces. These differences suggest that indium migration in spacer layers is caused by the strain fields induced by islands buried below, and is different at the three surfaces. Vertical electronic coupling between quantum dots is confirmed by photoluminescence temperature dependence.
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