Abstract
Thermochromic films of VO 2 were deposited by DC reactive magnetron sputtering on stainless steel substrate. Complex refractive indexes of VO 2 were determined by ellipsometric spectroscopy (0.35–16.5 μm) for different film thicknesses. Optical simulations were performed to model the spectral reflectance of the film/substrate system for a film thickness of 100 nm and 200 nm and to monitor the optical contrast of the thermochromic layers by comparing the spectral reflectance at 25 °C and 100 °C. The good agreement observed between experimental and theoretical spectra demonstrates the adequacy of the model for predicting the optical properties of the samples.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have