Abstract

Equations for the change in both the specular reflectance and the ellipsometric parameters for a flat surface following formation of a sub-monolayer molecular film are derived by taking explicit account of the particulate nature of the adsorbed film, while treating the substrate as a continuum. A dielectric constant tensor, Iµ, can be defined for the adsorbed film which, upon choosing an effective film thickness, de, so that Iµ is isotropic whenever the mean molecular polarizability of the adsorbed species is isotropic, takes a form essentially identical to that obtained using the Lorentz–Lorenz equation. In general, both Iµ and de vary with coverage in the range zero to one monolayer. For films consisting of island patches, however, Iµ is constant and de is proportional to coverage; while for films consisting of more or less randomly distributed molecules, de is approximately equal to the molecular diameter at all coverages up to one monolayer and Iµ varies with coverage.

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