Optical properties of phase-change optical disks with Sb xSe 100− x films

Abstract

Complex refractive indices of thermally evaporated Sb x Se 100− x thin films, both amorphous (as deposited) and crystallized after thermal treatment are determined in the spectral range 400–1000 nm. The results are used to simulate the optical characteristics (reflection, absorption and phase difference) of multilayer stack configurations including two protective dielectric layers, a reflective layer and Sb x Se 100− x thin films as a phase-change recording layer. Optimal multilayer stack configurations as a function of the recording layer composition are determined. The applicability of Sb x Se 100− x thin films as recording materials for CD-RW and DVD-RW optical disks at λ=640 and 780 nm is discussed.