Abstract
A model of the electronic structure of graphite-like carbon films, describing the semiconductor properties of this material, is presented. Spectra of optical constants of microcrystalline carbon films in the region λ = 0.4–8.0 μm were studied by the spectral ellipsometry and IR reflection methods. A number of distinctive features of the spectra, associated with both the appearance of CC- and CHn-type bonds and direct energy gaps, were found. Analysis of the optical data using the proposed model makes possible a common interpretation of our results and literature data. Values of a parameter Θ, which is an averaged qualitative parameter of structural distortions within carbon microcrystallites as compared with crystalline graphite, are determined from comparison of theoretical results and experimental data.
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