Abstract
The complex index of refraction in the spectral range of 0.74 to 4.5 eV is studied by variable-angle spectroscopic ellipsometry in ferroelectric K0.5Na0.5NbO3 films. The 20-nm-thick cube-on-cube-type epitaxial films are grown on SrTiO3(001) and DyScO3(011) single-crystal substrates. The films are transparent and exhibit a significant difference between refractive indices Δn = 0.5 at photon energies below 3 eV. The energies of optical transitions are in the range of 3.15–4.30 eV and differ by 0.2–0.3 eV in these films. The observed behavior is discussed in terms of lattice strain and strain-induced ferroelectric polarization in epitaxial perovskite oxide films.
Highlights
Perovskite-structure oxide ferroelectric crystals have long been used for optical applications due to their good nonlinear optical properties, high transparency and large index of refraction in the visible range [1, 2]
The complex index of refraction in the spectral range of 0.74 to 4.5 eV is studied by variable-angle spectroscopic ellipsometry in ferroelectric K0.5Na0.5NbO3 films
Cube-on-cube-type epitaxial growth of the KNNO films is revealed by x-ray diffraction (XRD) analysis
Summary
Perovskite-structure oxide ferroelectric crystals have long been used for optical applications due to their good nonlinear optical properties, high transparency and large index of refraction in the visible range [1, 2]. The observed behavior is discussed in terms of lattice strain and strain-induced ferroelectric polarization in epitaxial perovskite oxide films. The optical properties of epitaxial ferroelectric films can differ from those of the crystals [11, 12].
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