Abstract

Low temperature near band-edge absorption and luminescence spectra of Si-doped n-type GaP are reported. Electrical and optical evidence is presented that these spectra are due to the creation and decay of excitons bound to neutral Si donors on Ga sites. Several zero-phonon transitions, each with strong replications by momentum conserving phonons, were observed in both absorption and luminescence. From these measurements it is concluded that the ground state of the Si Ga donor is split into two sublevels 0.6 meV apart. Crystals containing a sufficiently low concentration of S to be suitable for a reliable analysis of temperature-dependent Hall-effect measurements were selected by combining 300°K Hall-effect data with low temperature S-exciton absorption data. The electrical measurements support the identification of Si as the main shallow donor. Moreover, it is concluded from these measurements that the degeneracy of the ground state of a Ga-site donor is 3 times that of a P-site donor, in agreement with theoretical expectations.

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