Abstract
TiO 2 thin films were spin-coated on Si (100) substrates via an aqueous sol–gel route using Ti(OBu n ) 4 and H 2O 2 as starting materials, and were annealed in air at different temperatures up to 550 °C for 1 h. X-Ray diffractometry indicates that crystallization into anatase started at 350 °C. The 350 °C-annealed films were further characterized by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and variable angle spectroscopic ellipsometry. The results show that homogeneous, carbon-free TiO 2 films with high refractive index ( n=2.3 at 550 nm) were successfully obtained under an annealing temperature as low as 350 °C. The indirect and direct optical absorption bandgaps of the anatase film are estimated as 3.23 and 3.80 eV, respectively.
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