Abstract
We report on the preparation and characterization of the planar and ridge waveguides in TGG crystals. The planar waveguide was formed by the 6.0-MeV Si-ion implantation with a dose of 2.0 × 1015 ions/cm2 and the precise diamond blade dicing technique was applied to manufacture the surface of the planar waveguide to construct the ridge structure. The images of planar and ridge cross-sections were photographed by a metallographic microscope. The SRIM 2013 was utilized to achieve the energy loss profiles of electrons and nuclei. The dark-mode spectra and the guiding properties were separately measured by the prism coupling and end-face coupling methods. The simulation processing on the refractive index profile and the near-field mode distribution were operated by the RCM and the BPM software, respectively. In consideration of the high-quality optical propagation performances, the TGG planar and ridge waveguides can serve as superior candidates in the magneto-optical devices.
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