Abstract
Dip coated films, widely used in the coating industry, are usually measured during fabrication by capacitive methods with micrometric precision. In this work, interferometric determination of thickness evolution in real time, for the first time to our best knowledge, is applied to a class of non‐Newtonian liquids with distinct viscosities. Thickness evolution during the process depends on time as predicted by a power‐law model. Comparison with measured results (uncertainty of ±0,007 μm) shows very good agreement after initial step of the process.
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