Abstract
Thermal emission spectra due to the virtual modes in LiF thin films are observed at high temperature up to 1053K. Anomalous softening of the mode frequency and increase of the mode width are observed above 1000K. The results of the ion micro-analysis indicates that the film heat-treated in nitrogen atmosphere at 1053K is largely shifted from stoichiometry, which is caused by the sublimation of fluorine ions from the film. The spectrum analysis using an infrared dielectric function in which the effects of defects is considered, results in the abrupt increase of the high-frequency dielectric constant with elevating temperature as well as the softening of the frequency and the increase of the damping for both the transverse and the longitudinal optical phonons.
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