Abstract
The α-type CuPc thin film prepared by thermal evaporation has the b-axes parallel to the substrate plane. We report the comparison of the optical structure and the height image of CuPc layer deposited on Si surface using the Near-field solid immersion lens (NSIL) and a contact AFM. The optical microstructure of CuPc surface was measured by focusing a laser beam(λ=442 nm) in a solid immersion lens(SIL).
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