Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures

Abstract

A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope (SNOM) and a dedicated spectrometer was realised. This setup allows investigations at various temperatures from room to liquid-helium temperature. After a description of the apparatus, scanning force topography images of self-assembled InAs quantum dots on a GaAs substrate with a density of less than one dot per square micron are shown, followed by first spectroscopic investigations of such a sample. The presented results demonstrate the potential of the system.