Abstract
The analysis of the effects of controlled optical losses in an external cavity Integrated Tunable Laser Assembly (ITLA) first leads to identify the failing element in a degraded identical device, and then allows to decode the effects of FIB-induced modifications on a DFB laser diode. The results open the way to much general considerations about fundamentals on laser diode characteristics, first on the physical meaning of the quantum efficiency, and then on the validation or rejection of two different models for the current threshold.
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