Abstract

Abstract Lateral variation in the concentration of Ni2+ in a nickel-containing, flat silica gel plate, caused by migration of the dopant during drying (60°C), was measured spectrophotometrically as a function of absorption of Ni2+ at 393 nm. Compositional variations along individual lines of measurement could be expressed as second order polynomials, and the overall distribution took the form of a shallow basin with a minimum at the central region of the gel plate.

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