Abstract
Abstract Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.
Highlights
The foundation of today’s scanning probe technique evolves from scanning tunneling microscope (STM) and atomic force microscope (AFM) pioneered by Binnig et al [1, 2], where a sharp tip scans across a surface; the detection of surface morphology relies on tunneling current in STM [1] and van der Waals forces between atoms on the sample and atoms on the tip in AFM [2]
We discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution
We focus on two main approaches: one through material absorption of light and the other through dipole forces, both detectable through variations of nanoscale forces. Another technique that relies on light scattering by the nanomaterials facilitated by the scanning probe technique is the near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM)
Summary
The light-matter interaction that gives rise to optically induced forces was at the heart of major breakthroughs in nanoscale imaging and manipulation of nanoscale to microscale objects. These optical forces which are associated with local electromagnetic field gradient, radiation. Jahan et al.: Optical force microscopy pressure, and/or thermal expansion of materials, are of fundamental importance in applications ranging from optical trapping [11,12,13,14,15,16,17,18,19,20] to modern microscopy techniques [21,22,23,24,25,26]
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