Optical floating zone growth and dielectric constants of near-3:2 mullite crystals

Abstract

Near-3:2 mullite crystals have been grown successfully with the optical floating zone technique. The growth direction of mullite crystals is along the c axis and growth rate can be reached 10mm/h. The effect of growth rates on the crystal quality has been studied. The crystalline phase, crystal quality, microstructure, composition distribution of the grown crystals were characterized by powder X-ray diffraction, single crystal X-ray diffraction, scanning electron microscope, electron probe micro-analyzer and Raman spectra, respectively. The grown mullite crystal is formed by peritectic structure with near 3:2 mullite crystal as main face and lamellar or needle-like SiO2-rich aluminosilicate as secondary phase that parallel to the crystal growth direction. The measured dielectric properties show large dielectric anisotropy and good temperature stability in near-3:2 mullite crystals.