Abstract
The optical analysis of images obtained with electron microscopes has been widely developed for structural determination of periodic biological objects and for microscope aberration correction in images of periodic or non periodic objects.Our present purpose is to improve the signal to noise ratio of high resolution micrographs of crystal defects recorded at the Scherzer focalus with the 500 kV Kyoto electron microscope. It is not necessary to correct for sign reversals since the microscope transfer function has the same sign over the 0.13 Å-1 - 0.4 Å-1 spatial frequency domain. Our images are noisy due to photographic or electron processes and to object contamination. Thus a simple binary amplitude filter is placed in the optical Fourier transform plane of the object to remove the noise. As the mask shape has a great influence on the information contained in the reconstructed image we have tested the restoration of two nearly similar dislocation cores with two different masks.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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