Optical edge-enhanced imaging based on dielectric metasurfaces

Abstract

Optical edge-enhanced imaging is an effective method for boundary extraction, and it is also a cutting-edge technology for object detection in image processing. With the rapid development of metamaterial and metasurface fields, the miniaturization and lightweight of optical devices have reached a new scale. At present, the experimental research of optical edge-enhanced imaging using metasurface is insufficient and lags behind the theoretical research. In this paper, we propose optical edge-enhanced imaging based on a Huygens phase metasurface in the near-infrared (NIR). The entire optical edge-enhanced process is simulated, and the feasibility of the method is verified theoretically. Then, the edge-enhanced of numbers, letters, and biological tissues is carried out experimentally, and the results are consistent with the simulation results. This study proposes a near-infrared dielectric metasurface-based edge-enhanced imaging that can find important applications in compact optical platforms such as image processing.