Abstract

The authors have proposed a complete large-signal (L-S) model to investigate the optical modulation of high frequency properties of double-drift region (DDR) impact avalanche transit time (IMPATT) devices operating at different millimeter-wave and sub-millimeter-wave frequencies. Simulation is carried out based on the proposed model to study the effect of photo-irradiation of different values of incident optical power of different wavelengths from 600---1000 nm on the DC and L-S characteristics of DDR IMPATTs based on Si designed to operate at 94, 140, 220, 300 and 500 GHz. Two different optical illumination configurations such as top mount and flip chip are taken into account for the present study. Results show that the maximum optical tuning of L-S parameters of the device can be achieved for optical illumination of wavelength 700 nm, i.e. near the wavelength corresponding to the responsivity peak of Si in both top mount and flip chip configurations. Further, better photo-sensitivity of top mount structure is observed as compared to its flip chip counterpart. The simulation results are found to be in good agreement with the experimental results reported earlier. Suitable tunable light source information is also suggested to carry out the optical control experiment within the wavelength range under consideration.

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