Abstract
The pseudo-Brewster angle technique for determining the optical constants of an optically isotropic medium, is reviewed and a description of a reflectometer based on this measurement technique is described in detail. Room temperature values of the optical constants of two examples have been determined: a Ge film prepared by evaporating the semiconductor onto a substrate held at 410°C, well above the substrate temperature below which amorphous-like films occur, and an epitaxial layer of Si deposited on single crystal Si. A great value of modern thin-film technology is that it offers materials prepared in a controlled manner with unique, virgin, specular surfaces of importance for optical measurements and applications.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
