Optical Coherence Tomography for the Inspection of Plasma-Sprayed Ceramic Coatings

Abstract

Optical coherence tomography (OCT) is evaluated as a potential technique for microstructure characterization of plasma-sprayed ceramic coatings. OCT combines the principles of low-coherence interferometry and optical heterodyne detection to obtain both a high axial resolution and a high sensitivity to weakly backscattered light. It can be used to accurately locate interfaces where the refractive index changes abruptly within translucent materials. Therefore, OCT should be sensitive to interlamellar pores and splat interfaces within plasma-sprayed ceramic coatings. In the present work, OCT cross-sectional images of thin yttria-stabilized zirconia (YSZ) coatings are considered. The interferogram envelopes forming the collected images are analyzed individually to successfully gather information related to light attenuation inside the coatings. This light attenuation is shown to be related to the density of interfaces within the coatings as well as to the material oxidation state. The envelope analysis also allows the evaluation of the refractive index of the YSZ nontransformable tetragonal phase.