Abstract
Novel X-ray imaging detectors based on photoluminescence of colour centres in lithium fluoride (LiF) have been proposed and tested for extreme ultraviolet, soft and hard X-rays up to 10keV. For the first time we present the optical characterisation of LiF crystals and thin films irradiated at the TOPO–TOMO beamline of synchroton light source Anka (Karlsruhe, Germany) in the energy range 6–40keV for different exposure times. Absorption and photoluminescence spectra were analysed to study the optical response of the LiF-based detectors. High resolved X-ray imaging of commercial test patterns has been obtained on LiF crystals and films by optical readout with a confocal laser scanning fluorescence microscope.
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