Abstract
Using vacuum deposition, phthalocyanine films at constant and variable angles of vapor incidence on a substrate were produced. In some experiments, substrates were placed in a magnetic field, which was oriented along the surface. Hydrogen phthalocyanine films were processed with iodine and methyl iodide vapors. The anisotropy of samples was studied by the zero single-wave ellipsometry. In the experiments, the analyzer axis was oriented in the plane of incidence or in the plane of a sample, and a search for the polarizer and analyzer angles of suppression as functions of the polar angle of a sample was carried out. It is shown that the experimental data can be classified on the basis of three models proposed for the structure of phthalocyanine films. An expression for the description of anisotropy of films described by the three models is presented, and a method for finding parameters of a model is described. It is anticipated that reverse problems in the study of anisotropic media by ellipsometry can be solved without determining elements of the reflection matrix.
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