Abstract
Single crystal of Lu2Si2O7:Pr was grown by Czochralski method. Transmittance, photoluminescence excitation (PLE) and photoluminescence (PL) spectra, X-ray excited luminescence (XEL) and fluorescence decay time spectra of the sample were measured and discussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si2O7:Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 nm in the region from 200–260 nm. The PL spectrum was dominated by fast 3PJ→3HJ band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14f1→4f2 emission peaking at 265 nm. The 2D (temperature-intensity) and 3D (temperature-wavelength-intensity) thermally stimulated luminescence (TSL) spectra were measured. The Pr3+ ion was found to be the recombination center during the TSL process. Three obvious traps were detected in LPS:Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.