Abstract
The thin layers of undoped ZnS and ZnS doped La were deposited on glass substrates using sol-gel and dip-coating methods. The structural characterization of these samples was carried out by the X-rays diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). UV-visible spectrophotometry and Fourier Transform Infrared spectroscopy (FTIR) have been used to study the effect of deposition layers on the optical properties of ZnS doped La thin films. X-ray diffraction measurements show that these films are amorphous. Atomic force microscopy images of the films have revealed homogeneous and granular structure and the SEM micrographies show that the amorphous deposit films with uniform and porous structure. The optical transmission spectra in the UV - visible range have shown that the doped film present a good optical transmission ranging between 50% and 70% in the visible. The calculated values of gap were between 3.68 and 2.77 eV. Doping with lanthanum decrease the optical gap of ZnS. Analysis FTIR of the samples confirm the presence of the vibration band of Zn-S at 668 cm−1.
Published Version
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