Abstract
Thin films were grown by vacuum co-evaporation of CsI and PbI2 compounds from two independent crucibles. X-ray diffraction spectroscopy revealed formation of CsPbI3 and Cs4PbI6 nanoaggregates in the thin film samples and gave an estimate of their volume percentage as well. It provided also the grain size estimates, which were compared with direct observation of a thin film surface by atomic force microscopy. The absorption, luminescence and decay kinetics characteristics of thin films grown were measured. The optical characteristics of the mentioned ternary nanoaggregates were determined and compared with those of CsPbX3 and Cs4PbX6 (X = Cl, Br) bulk structures.
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